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TCD2255D 2001-10-15 1 toshiba ccd linear image sensor ccd (charge coupled device) TCD2255D the TCD2255D is a high sensitive and low dark current 2700 elements3 line ccd color image sensor which includes ccd drive circuit, clamp circuit and sample & hold circuit. the sensor is designed for scanner. the device contains a row of 2700 elements3 line photodiodes which provide a 12 lines / mm (300dpi) across a a4 size paper. the device is operated by 5v pulse and 12v power supply. features number of image sensing elements : 2700 elements3 line image sensing element size : 8m by 8m on 8m centers photo sensing region : high sensitive and low dark current pn photodiode distance between photodiode array : 32m (4 lines) clock : 2 phase (5v) power supply : 12v power supply voltage internal circuit : sample & hold circuit, clamp circuit package : 22 pin cerdip package color filter : red, green, blue pin connection (top view) weight: 4.5g (typ.)
TCD2255D 2001-10-15 2 maximum ratings (note 1) characteristic symbol rating unit clock pulse voltage v a shift pulse voltage v sh reset pulse voltage v rs clamp pulse voltage v cp sample and hold pulse voltage v sp electrical shutter voltage v icg ? 0.3~8.0 v power supply voltage v od ? 0.3~15 v operating temperature t opr 0~60 c storage temperature t stg ? 25~85 c note 1: all voltage are with respect to ss terminals (ground). circuit diagram
TCD2255D 2001-10-15 3 pin names pin no. symbol name pin no. symbol name 1 os2 signal output 2 (green) 22 os1 signal output 1 (blue) 2 os3 signal output 3 (red) 21 ss ground 3 ss ground 20 nc non connection 4 od power 19 sp sample and hold gate 5 rs reset gate 18 cp clamp gate 6 nc non connection 17 ss ground 7 icg3 electric shatter gate 3 16 icg1 electric shatter gate 1 8 2a2 clock 2 (phase 2) 15 2a1 clock 1 (phase 2) 9 sh3 shift gate 3 14 sh1 shift gate 1 10 1a2 clock 2 (phase 1) 13 1a1 clock 1 (phase 1) 11 sh2 shift gate 2 12 icg2 electric shatter gate 2 optical / electrical characteristics (ta = 25c, v od = 12v, v = v rs = v sh = v cp = 5v (pulse), f = 1.0mhz, f rs = 1.0mhz, load resistance = 100k ? , t int (integration time) = 10ms, light source = a light source+cm500s filter (t = 1.0mm) ) characteristic symbol min typ. max unit note r r 9.1 13.0 16.9 r g 11.4 16.3 21.2 sensitivity r b 4.0 5.7 7.4 v / (lxs) (note 2) prnu (1) D 10 20 % (note 3) photo response non uniformity prnu (3) D 2.5 10 mv (note 4) image lag il D 0.01 D % (note 5) saturation output voltage v sat 1.7 2.0 D v (note 6) saturation exposure se D 0.12 D lxs (note 7) dark signal voltage v drk D 3 9 mv (note 8) dark signal non uniformity d snu D 4 12 mv (note 8) dc power dissipation p d D 200 300 mw total transfer efficiency tte 92 D D % output impedance z o D 0.4 1.0 k ? dc signal output voltage v os 3.0 5.0 7.0 v (note 9) random noise n d D 0.7 D mv (note 10) reset noise v rs D 1.5 D v (note 9)
TCD2255D 2001-10-15 4 note 2: sensitivity is defined for each color of signal outputs average when the photosensitive surface is applied with the light of uniform illumination and uniform color temperature. note 3: prnu (1) is defined for each color on a single chip by the expressions below when the photosensitive surface is applied with the light of uniform illumination and uniform color temperature. prnu (1) = 100 (%) when is average of total signal outputs and is the maximum deviation from . the amount of incident light is shown below. red = 2 1 se, green = 2 1 se, blue = 4 1 se note 4: prnu (3) is defined as maximum voltage with next pixel, where measured 5% of se (typ.). note 5: image lag is defined as follows. note 6: v sat is defined as minimum saturation output of all effective pixels. note 7: definition of se : se = g r sat v (lxs) note 8: v drk is defined as average dark signal voltage of all effective pixels. dsnu is defined as different voltage between v drk and v mdk when v mdk is maximum dark signal voltage.
TCD2255D 2001-10-15 5 note 9: dc signal output voltage reset noise is defined as follows, but reset noise is a fixed pattern noise. note 10: random noise is defined as the standard deviation (sigma) of the output level difference between two adjacent effective pixels under no illumination (i.e. dark conditions) calculated by the following procedure. 1) two adjacent pixels (pixel n and n+1) in one reading are fixed as measurement points. 2) each of the output level at video output periods averaged over 200ns period to get v (n) and v (n+1). 3) v (n+1) is subtracted from v (n) to get ? v. ? v = v (n) ? v (n+1) 4) the standard deviation of ? v is calculated after procedure 2) and 3) are repeated 30 times (30 readings). 30 1 i 2 v vi 30 1 30 1 i vi 30 1 v 5) procedure 2), 3) and 4) are repeated 10 times to get 10 sigma values. 6) 10 sigma values are averaged. 10 1 i j 10 1 7) value calculated using the above procedure is observed 2 times larger than that measured relative to the ground level. so we specify the random noise as follows. 2 1 d n
TCD2255D 2001-10-15 6 operating condition characteristic symbol min typ. max unit note ?h? level 4.7 5.0 5.5 clock pulse voltage ?l? level v a 0 0 0.05 v ?h? level v a?h? ? 0.5 v a?h? v a?h? shift pulse voltage ?l? level v sh 0 0 0.3 v (note 11) ?h? level 4.5 5.0 5.5 reset pulse voltage ?l? level v rs 0 0 0.3 v ?h? level 4.5 5.0 5.5 sample and hold pulse voltage ?l? level v sp 0 0 0.3 v (note 12) ?h? level 4.5 5.0 5.5 clamp pulse voltage ?l? level v cp 0 0 0.3 v ?h? level v a?h? ? 0.5 v a?h? v a?h? icg pulse voltage ?l? level v icg 0 0 0.3 v (note 11) power supply voltage v od 11.4 12.0 13.0 v note 11: v a?h? means the high level voltage of v a when sh pulse is high level. note 12: supply ?l? level to sp terminal when sample and hold circuitry is not used. clock characteristics (ta = 25c) characteristic symbol min typ. max unit clock pulse frequency f a D 1.0 5.0 mhz reset pulse frequency f rs D 1.0 5.0 mhz clamp pulse frequency f cp D 1.0 5.0 mhz sample and hold pulse frequency f sp D 1.0 5.0 mhz clock capacitance c a D 160 250 pf shift gate capacitance c sh D 20 30 pf reset gate capacitance c rs D 20 30 pf sample and hold gate capacitance c sp D 20 30 pf clamp gate capacitance c cp D 20 30 pf icg gate capacitance c icg D 20 30 pf
TCD2255D 2001-10-15 7 timing chart (bit clamp mode)
TCD2255D 2001-10-15 8 timing chart (line clamp mode)
TCD2255D 2001-10-15 9 timing requirements (line clamp mode)
TCD2255D 2001-10-15 10 timing requirements (cont.) characteristic symbol min typ. (note 13) max unit t1 120 1000 D pulse timing of sh and 1 t5 800 1000 D ns sh pulse rise time, fall time t2, t4 0 50 D ns sh pulse width t3 3000 5000 D ns pulse timing of sh and cp t6 0 500 D ns 1 , 2 pulse rise time, fall time t7, t8 0 20 D ns pulse timing of 1 and rs t9 0 20 D ns rs pulse rise time, fall time t10, t11 0 20 D ns rs pulse width t12 55 100 D ns pulse timing of rs and cp t13 10 30 D ns pulse timing of cp and 1 t14 0 20 D ns cp pulse rise time, fall time t15, t16 0 20 D ns cp pulse width t17 50 100 D ns video data delay time (note 14) t18 70 100 D ns sp pulse rise time, fall time t19, t20, 25, t26 0 20 D ns sp pulse width t21, t27 50 100 D ns pulse timing of rs and sp t22 0 20 D ns pulse timing of 1 and sp t23, t24 0 20 D ns icg pulse width t18 5 D D s pulse timing of icg and rs t29 0 20 D ns note 13: typ. is the case of f rs = 1.0mhz. note 14: load resistance is 100k ? .
TCD2255D 2001-10-15 11 application note on off sample & hold function sp pulse sp = low electrical shutter function icg pulse icg = low clamp mode selection bit clamp cp pulse line clamp cp = sh typical spectral reponse / moduration tranfer function
TCD2255D 2001-10-15 12 typical drive circuit
TCD2255D 2001-10-15 13 caution 1. window glass the dust and stain on the glass window of the package degrade optical performance of ccd sensor. keep the glass window clean by saturating a cotton swab in alcohol and lightly wiping the surface, and allow the glass to dry, by blowing with filtered dry n2. care should be taken to avoid mechanical or thermal shock because the glass window is easily to damage. 2. electrostatic breakdown store in shorting clip or in conductive foam to avoid electrostatic breakdown. ccd image sensor is protected against static electricity, but interior puncture mode device due to static electricity is sometimes detected. in handing the device, it is necessary to execute the following static electricity preventive measures, in order to prevent the trouble rate increase of the manufacturing system due to static electricity. a. prevent the generation of static electricity due to friction by making the work with bare hands or by putting on cotton gloves and non-charging working clothes. b. discharge the static electricity by providing earth plate or earth wire on the floor, door or stand of the work room. c. ground the tools such as soldering iron, radio cutting pliers of or pincer. it is not necessarily required to execute all precaution items for static electricity. it is all right to mitigate the precautions by confirming that the trouble rate within the prescribed range. 3. incident light ccd sensor is sensitive to infrared light. note that infrared light component degrades resolution and prnu of ccd sensor. 4. lead frame forming since this package is not strong against mechanical stress, you should not reform the lead frame. we recommend to use a ic-inserter when you assemble to pcb. 5. soldering soldering by the solder flow method cannot be guaranteed because this method may have deleterious effects on prevention of window glass soiling and heat resistance. using a soldering iron, complete soldering within ten seconds for lead temperatures of up to 260c, or within three seconds for lead temperatures of up to 350c.
TCD2255D 2001-10-15 14 package dimensions note 1: no.1 sensor element (s1) to edge of package. note 2: top of chip to bottom of package. note 3: glass thickness (n = 1.5) note 4: no.1 sensor element (s1) to edge of no.1 pin. weight: 4.5g (typ.)
TCD2255D 2001-10-15 15 toshiba is continually working to improve the quality and reliability of its products. nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. it is the responsibility of the buyer, when utilizing toshiba products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such toshiba products could cause loss of human life, bodily injury or damage to property. in developing your designs, please ensure that toshiba products are used within specified operating ranges as set forth in the most recent toshiba products specifications. also, please keep in mind the precautions and conditions set forth in the ?handling guide for semiconductor devices,? or ?toshiba semiconductor reliability handbook? etc.. the toshiba products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.). these toshiba products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (?unintended usage?). unintended usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. unintended usage of toshiba products listed in this document shall be made at the customer?s own risk. the products described in this document are subject to the foreign exchange and foreign trade laws. the information contained herein is presented only as a guide for the applications of our products. no responsibility is assumed by toshiba corporation for any infringements of intellectual property or other rights of the third parties which may result from its use. no license is granted by implication or otherwise under any intellectual property or other rights of toshiba corporation or others. the information contained herein is subject to change without notice. 000707eb a restrictions on product use

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